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Electronics is now present in all human
activity fields and the related mission profiles have become extremely
tough, particularly, regarding environmental constraints. Concurrently,
the technology miniaturization down to the nanoscale and the increasing
complexity of integrated circuits (ICs) with the concepts of
System-On-Chip (SOC) and System-In-Package (SIP) makes them more
susceptible to various stresses and more difficult to meet robustness
requirements. This trend will even worsen with the introduction of
heterogeneous systems including both silicon micro-machined (MEMS)
devices, signal processing and communication interfaces. Already, we
interact daily and unconsciously with different MEMS devices: pressure
sensors, accelerometers, ink-jets, and micro-mirrors for display
projectors are the most ubiquitous ones; the automotive,
industrial and medical applications being the biggest markets. The
generalization of embedded systems and the critical safety issues in
electronic applications such as the medical, space, aerospace,
automotive, car-by-wire and fly-by-wire ones, require a higher
reliability level of the electronic systems. Electrical (EOS/ESD) and
electromagnetic (EMI) stresses are
known to be at the origin of about 30 to 50% of the ICs failures both
at the design phase and on the field. The efficiency of the integrated
protections is decreasing with technology shrinking. In the future,
Wireless Sensors Networks, Domestic Robots, Smart Pills, and
Lab-On-Chips may generate new exciting markets for selected MEMS
products, but one brake on the widespread use of these emerging
applications is the related reliability issues. To cope with these
reliability issues, both a global approach from the system level to the
chip level and the co-design of the various protection strategies (EOS,
ESD and EMI) will be required to provide efficient protection
solutions.
The aim of this third edition of the EOS/ESD/EMI Workshop is to favor a cross-fertilization between experts and researchers in the fields of ESD, EMI and failure analysis. To increase these interactions, this workshop is now open to the European community and will be held over two days on May 18-19, 2006 in TOULOUSE at Institut Aéronautique et Spatial (IAS) site. On the morning of the first day, two tutorials of 1h30: one dedicated to ESD and one dedidated to EMI susceptibility will be given by experts of the field. Papers addressing the immunity issues of electronic applications to electrical (EOS/ESD) and electromagnetic (EMI) stresses, both at system level and chip level, are welcome. We encourage the submission of papers covering the various aspects: design of protections, testing, failure analysis, case studies, modeling for predictive reliability, etc... We hope to see you in Toulouse, not only the “pink”city but also the city of the first successfull flight of the A380 AIRBUS plane. Marise Bafleur, LAAS-CNRS, Technical Program Chair Philippe Perdu, CNES, Technical Program Vice-Chair |
Submission:Deadline :
April 3rd, 2006 Abstract: 3 pages including figures. Paper template to download: word, pdf Send a PDF file by email to isabelle.nolhier@laas.fr |
Topics :Immunity issues of electronic applications to electrical (EOS/ESD) and electromagnetic (EMI) stresses, both at system level and chip level
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Registration:The EOS/ESD/EMI Workshop will be entirely FREE thanks to the sponsoring of CNES/CCT, LAAS-CNRS, Paul Sabatier University, Region Midi-Pyrenees, Aerospace Valley Competitiveness Cluster, MB Electronique, ORYX Instruments Corp.Registration includes the proceedings of the tutorials and of the papers as well as lunches on May 18 and 19, dinner on May 18 and all coffee breaks. However, to attend you need to registrate not later than May 5th, 2006. Please send back by email or fax the registration form to the workshop secretariat : inolhier@laas.fr or fax:+33-561 336 208. Accommodation: We suggest that you plan your travel arrangements as soon as possible. Finding a hotel in Toulouse at this period of the year can sometimes be a difficult challenge. You will find a list of some hotels downtown Toulouse at: http://www2.laas.fr/laas/1-5528-Listes-des-hotels.php A complete list of hotels in Toulouse can be found at: http://ott.totemstream.com/english/hebergements/index.lasso In case of any difficulty, do not hesitate to contact the workshop secretariat. More travel information |
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Access to IAS (PDF Map)
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Contact :
isabelle.nolhier@laas.fr Fax :
+33(0)5.61.33.62.08 |